mmpp: Various Similarity and Distance Metrics for Marked Point
Processes
Compute similarities and distances between marked point processes.
| Version: | 0.6 | 
| Published: | 2017-09-29 | 
| DOI: | 10.32614/CRAN.package.mmpp | 
| Author: | Hideitsu Hino, Ken Takano, Yuki Yoshikawa, and Noboru Murata | 
| Maintainer: | Hideitsu Hino  <hinohide at cs.tsukuba.ac.jp> | 
| License: | GPL-2 | 
| NeedsCompilation: | no | 
| Materials: | NEWS | 
| CRAN checks: | mmpp results | 
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