CTxCC: Multivariate Normal Mean Monitoring Through Critical-to-X
Control Chart
A comprehensive set of functions designed for multivariate mean monitoring using the Critical-to-X Control Chart. These functions enable the determination of optimal control limits based on a specified in-control Average Run Length (ARL), the calculation of out-of-control ARL for a given control limit, and post-signal analysis to identify the specific variable responsible for a detected shift in the mean. This suite of tools provides robust support for precise and effective process monitoring and analysis.
| Version: |
0.4.0 |
| Depends: |
combinat, matrixcalc, stats, mvtnorm, expm, CompQuadForm, ggplot2 |
| Published: |
2025-08-27 |
| DOI: |
10.32614/CRAN.package.CTxCC |
| Author: |
Burcu Aytaçoğlu [aut] (burcuaytacoglu@gmail.com),
Diana Barraza-Barraza [aut, cre] (diana.barraza@ujed.mx),
Víctor G. Tercero-Gómez [aut] (victor.tercero@tec.mx),
A. Eduardo Cordero-Franco [aut] (lalo.cordero@gmail.com) |
| Maintainer: |
Diana Barraza-Barraza <diana.barraza at ujed.mx> |
| License: |
GPL-2 | GPL-3 [expanded from: GPL (≥ 2)] |
| NeedsCompilation: |
no |
| SystemRequirements: |
Intel MKL (optional for optimized BLAS/LAPACK
performance) |
| CRAN checks: |
CTxCC results |
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